TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 17430
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 10149
 
  
 
H03K PULSE TECHNIQUE 8123
 
  
 
G11C STATIC STORES 6145
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 6356
 
  
 
H03L AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES 575
 
  
 
A61B DIAGNOSIS; SURGERY; IDENTIFICATION 4236
 
  
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 3108
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 3282
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 3239

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0238,806 METHOD AND APPARATUS FOR IN-VIVO SPATIOTEMPORAL IMAGING OF TISSUE PROTEIN CLUSTERSFeb 22, 16Aug 24, 17[A61B]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9379892 Trusted manager bridgeMay 30, 13Jun 28, 16[H04L, G06F]
9380226 System and method for extraction of a dynamic range zone imageJun 04, 14Jun 28, 16[H04N]
9313418 Method and apparatus for detection of biological conditionsMay 30, 13Apr 12, 16[H04N, G01N, A61B]
9295423 System and method for audio kymographic diagnosticsApr 03, 13Mar 29, 16[A61B]
9220413 Stent apparatus with integrated imaging element for in situ detection of buildup of material in a vascular systemApr 25, 13Dec 29, 15[A61F, A61B]
9220462 Imaging sensor and method for biometric mapping of facial skinMay 24, 13Dec 29, 15[H04N, A61B]
9208864 Semiconductor memory with integrated biologic elementOct 14, 13Dec 08, 15[G11C]
8822342 Method to reduce depth delta between dense and wide features in dual damascene structuresDec 30, 10Sep 02, 14[H01L]
8772942 Interconnect structure employing a Mn-group VIIIB alloy linerJan 26, 10Jul 08, 14[H01L]
8716134 Interconnect structure employing a Mn-group VIIIB alloy linerFeb 28, 13May 06, 14[H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0007,408 SELF-ADAPTING SIGNAL COMMUNICATING SYSTEMAbandonedJul 02, 14Jan 07, 16[H04B, H04W]
2015/0255,589 INDIUM-CONTAINING CONTACT AND BARRIER LAYER FOR III-NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR DEVICESAbandonedMar 10, 14Sep 10, 15[H01L]
8332447 Systems and methods for performing fixed-point fractional multiplication operations in a SIMD processorExpiredSep 08, 09Dec 11, 12[G06F]
8122279 Multiphase clocking systems with ring bus architectureExpiredApr 21, 08Feb 21, 12[G06F]
8108813 Structure for a circuit obtaining desired phase locked loop duty cycle without pre-scalerExpiredMay 30, 08Jan 31, 12[G06F]
8041537 Clock duty cycle measurement with charge pump without using reference clock calibrationExpiredJun 27, 08Oct 18, 11[G04F]
8032850 Structure for an absolute duty cycle measurement circuitExpiredMay 30, 08Oct 04, 11[G06F, G01R]
7969250 Structure for a programmable interpolative voltage controlled oscillator with adjustable rangeExpiredMay 30, 08Jun 28, 11[H03B]
7886257 Methods for hierarchical noise analysisExpiredApr 02, 08Feb 08, 11[G06F]
7831812 Method and apparatus for operating an age queue for memory request operations in a processor of an information handling systemExpiredAug 31, 07Nov 09, 10[G06F]
7737794 Phase locked loop with temperature and process compensationExpiredMay 14, 08Jun 15, 10[G01R]
7730290 Systems for executing load instructions that achieve sequential load consistencyExpiredFeb 25, 08Jun 01, 10[G06F]
7719880 Method and system for semiconductor memoryExpiredFeb 12, 08May 18, 10[G11C]
7716516 Method for controlling operation of microprocessor which performs duty cycle correction processExpiredJun 21, 06May 11, 10[G06F]
7642863 Systems and methods for PLL linearity measurement, PLL output duty cycle measurement and duty cycle correctionExpiredDec 07, 07Jan 05, 10[H03L, G01R]
2009/0322,311 Method and Apparatus for On-Chip Testing of High Speed Frequency DividersAbandonedJun 27, 08Dec 31, 09[G06F, G01R]
7627771 Clock control hierarchy for integrated microprocessors and systems-on-a-chipExpiredOct 04, 05Dec 01, 09[H04L, G06F]
7573735 Systems and methods for improving memory reliabilityExpiredSep 08, 06Aug 11, 09[G11C]
2009/0189,227 STRUCTURES OF SRAM BIT CELLSAbandonedJan 25, 08Jul 30, 09[H01L]
2009/0173,967 STRAINED-CHANNEL FET COMPRISING TWIST-BONDED SEMICONDUCTOR LAYERAbandonedJan 04, 08Jul 09, 09[H01L]

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