Taylor Hobson Limited

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS2177
 
 
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR463
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 3436
 
 
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 259
 
 
 
G01C MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 1102
 
 
 
G01F MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME 156
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1192
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
 
 
G05B CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS 194
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1194

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0089,695 Device And Method For Geometrically Measuring An ObjectMay 13, 15Mar 30, 17[G01B, G01M]
2017/0082,521 Device And Method For Geometrically Measuring An ObjectMay 13, 15Mar 23, 17[G01B, G01M]
2017/0067,729 METHOD AND APPARATUS FOR CHARACERISING INSTRUMENT ERRORApr 27, 15Mar 09, 17[G01B]
2015/0292,979 ANALYSING AND MACHINING AN OPTICAL PROFILENov 21, 13Oct 15, 15[G01M]
2015/0142,360 METROLOGICAL APPARATUS AND A METHOD OF DETERMINING A SURFACE CHARACTERISTIC OR CHARACTERISTICSJul 19, 13May 21, 15[G01B]
2015/0025,844 SURFACE MEASUREMENT APPARATUS AND METHODFeb 27, 13Jan 22, 15[G01D, G01B]
2015/0025,845 SURFACE MEASUREMENT APPARATUS AND METHODFeb 27, 13Jan 22, 15[G01D, G01B]
2015/0012,245 MEASUREMENT APPARATUS AND METHODFeb 13, 13Jan 08, 15[G01B, G01M]
2012/0278,035 SURFACE MEASUREMENT INSTRUMENT AND METHODNov 01, 10Nov 01, 12[G06F]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9322631 Surface measurement instrument and calibration thereofMar 01, 11Apr 26, 16[G01B, G06F]
9146197 Method and apparatus for determining phase fractions of multiphase flowsMar 11, 10Sep 29, 15[G01R, G01F, G01N]
8635783 Surface measurement instrument and methodOct 15, 09Jan 28, 14[G01B]
8543353 Apparatus for and a method of determining surface characteristicsJan 18, 12Sep 24, 13[G01B]
8489359 Surface measurement instrumentJan 18, 11Jul 16, 13[G01B]
8296098 Metrological instrumentJan 25, 06Oct 23, 12[G01C, G01B]
8112246 Apparatus for and a method of determining surface characteristicsDec 15, 06Feb 07, 12[G01B]
8051576 Metrological apparatus for measuring surface characteristicsMay 01, 07Nov 08, 11[G01B]
7970579 Apparatus for and a method of determining surface characteristicsNov 22, 06Jun 28, 11[G01B, G06F]
7948634 Surface profiling apparatusMay 06, 08May 24, 11[G01B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0347,660 METROLOGICAL APPARATUSABANDec 19, 12Nov 27, 14[G01J]
2014/0343,893 METROLOGICAL APPARATUS AND A METHOD OF DETERMINING A SURFACE CHARACTERISTIC OR CHARACTERISTICSABANNov 28, 12Nov 20, 14[G01B]
8239163 Apparatus for and a method of determining surface characteristicsExpiredMay 26, 11Aug 07, 12[G01B, G06F]
7518733 Surface profiling apparatusExpiredNov 21, 03Apr 14, 09[G01B]
2007/0177,156 Surface profiling method and apparatusABANJul 14, 04Aug 02, 07[G01B]
6505141 Transducer circuitExpiredJan 09, 01Jan 07, 03[G01B]
6450016 Stylus support assembly with flexed ligament hingeExpiredMay 23, 00Sep 17, 02[G01B]
6401349 Surface measuring apparatusExpiredAug 04, 98Jun 11, 02[G01B]
6344656 Surface measuring apparatus having relative displacement between a probe and its carriageExpiredJul 21, 00Feb 05, 02[G01N]
6345107 Image processing apparatus and method of processing height data to obtain image data using gradient data calculated for a plurality of different points of a surface and adjusted in accordance with a selected angle of illuminationExpiredDec 02, 99Feb 05, 02[G06K]
6327788 Surface form measurementExpiredJan 20, 99Dec 11, 01[G01B]
6031928 Image processing apparatus and method of processing height data to obtain image data using gradient data calculated for a plurality of different points of a surface and adjusted in accordance with a selected angle of illuminationExpiredFeb 18, 97Feb 29, 00[E01C, G06K]
5847270 Stylus attachment for a metrological instrumentExpiredMay 21, 97Dec 08, 98[G01B]
5740616 Metrological instrument with stylus for traversing workpieceExpiredMay 12, 95Apr 21, 98[G01B]
5579108 System and method for detecting the angle of a light beam using a mask with a transmissivity patternExpiredOct 14, 94Nov 26, 96[G01B]
5572798 Metrological apparatusExpiredJul 08, 95Nov 12, 96[G01B]
5488476 Apparatus and method using optical diffraction to measure surface roughnessExpiredOct 12, 94Jan 30, 96[G01B]
5272818 Device for detecting the location of a machine toolExpiredAug 27, 92Dec 28, 93[B23Q]
5209131 MetrologyExpiredOct 12, 90May 11, 93[G01B]
5150314 Metrological apparatus and calibration method thereforExpiredJun 22, 90Sep 22, 92[G01D, H03M]

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