Ultrapointe Corporation

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 7199
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 474
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 2196
 
  
 
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 166
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204
 
  
 
G07B TICKET-ISSUING APPARATUS; FARE-REGISTERING APPARATUS; FRANKING APPARATUS126

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6288782 Method for characterizing defects on semiconductor wafersMay 05, 99Sep 11, 01[G01N]
6167148 Method and system for inspecting the surface of a waferJun 30, 98Dec 26, 00[G06K]
6148114 Ring dilation and erosion techniques for digital image processingNov 27, 96Nov 14, 00[G06K]
5980187 Mechanism for transporting semiconductor-process masksApr 17, 97Nov 09, 99[B65G]
5963314 Laser imaging system for inspection and analysis of sub-micron particlesOct 15, 96Oct 05, 99[G01N]
5923430 Method for characterizing defects on semiconductor wafersFeb 03, 97Jul 13, 99[G01N]
5808735 Method for characterizing defects on semiconductor wafersNov 26, 96Sep 15, 98[G01N]
5798830 Method of establishing thresholds for image comparisonNov 27, 96Aug 25, 98[G01N]
5783814 Method and apparatus for automatically focusing a microscopeDec 26, 96Jul 21, 98[G01J]
5761336 Aperture optimization method providing improved defect detection and characterizationJan 16, 96Jun 02, 98[G07B, G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
H001530 Surface extraction from a three-dimensional data setExpiredJun 17, 93May 07, 96[G06F]

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