UNITED MICROELECTRONICS CORP.

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Technologies

Intl Class Technology MATTERS Rank in Class
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 3248 13
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 177 279
 
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 143 25
 
 
G11C STATIC STORES 118 65
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 80 86
 
 
H03K PULSE TECHNIQUE 49 84
 
 
H02H EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS 40 41
 
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 35 32
 
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 33 26
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 24 181
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Top Patents (by citation)

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0076,205 SEMICONDUCTOR INTEGRATED CIRCUIT STRUCTURE AND METHOD FOR FORMING THE SAME Sep 09, 16 Mar 15, 18 [H01L]
2018/0076,207 MASK ROM AND PROCESS FOR FABRICATING THE SAME Sep 13, 16 Mar 15, 18 [H01L]
2018/0076,500 MICROSTRIP LINE STRUCTURE AND METHOD FOR FABRICATING THE SAME Sep 10, 16 Mar 15, 18 [H01P]
2018/0067,241 COLOR FILTER DEVICE AND FORMING METHOD THEREOF Oct 19, 16 Mar 08, 18 [G02B, G01J, H01L]
2018/0069,089 METHOD OF FORMING SEMICONDUCTOR STRUCTURE Oct 31, 17 Mar 08, 18 [H01L]
2018/0057,354 SEMICONDUCTOR SENSOR AND METHOD OF MANUFACTURING THE SAME Oct 14, 16 Mar 01, 18 [B81C, B81B, G01N]
2018/0061,752 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Sep 20, 16 Mar 01, 18 [H01L]
2018/0061,950 TRANSISTOR DEVICE WITH THRESHOLD VOLTAGE ADJUSTED BY BODY EFFECT Aug 30, 16 Mar 01, 18 [H01L]
2018/0061,963 FABRICATING METHOD OF SEMICONDUCTOR STRUCTURE Aug 30, 16 Mar 01, 18 [H01L]
2018/0053,729 ALIGNMENT MARK STRUCTURE WITH DUMMY PATTERN Aug 16, 16 Feb 22, 18 [H01L]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9922832 Manufacturing method of semiconductor structure Jun 21, 17 Mar 20, 18 [H01L]
9922834 Semiconductor device and fabrication method thereof Aug 07, 15 Mar 20, 18 [H01L]
9922881 Method for fabricating semiconductor device structure and product thereof Jan 12, 16 Mar 20, 18 [H01L]
9922882 Manufacturing method of semiconductor structure May 16, 17 Mar 20, 18 [H01L]
9922948 Semiconductor device with modified pad spacing structure Apr 27, 16 Mar 20, 18 [H01L]
9922974 Semiconductor device and method for fabricating the same Jul 05, 17 Mar 20, 18 [H01L]
9922982 Electric fuse structure Nov 30, 16 Mar 20, 18 [H01L]
9923028 Resistive memory and method for manufacturing the same Jan 10, 17 Mar 20, 18 [H01L]
9923071 Semiconductor process Aug 21, 17 Mar 20, 18 [H01L]
9923095 Manufacturing method of non-planar FET Dec 15, 16 Mar 20, 18 [H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2018/0033,636 METHOD OF FABRICATING A SEMICONDUCTOR STRUCTURE ABAN Jul 27, 16 Feb 01, 18 [H01L]
2017/0222,026 METHOD OF FABRICATING FIN FIELD EFFECT TRANSISTOR ABAN Feb 03, 16 Aug 03, 17 [H01L]
2017/0207,079 SUBSTRATE CLEANING METHOD ABAN Jan 15, 16 Jul 20, 17 [B08B, H01L]
2017/0194,212 SEMICONDUCTOR DEVICE AND METHOD FOR FABRIACTING THE SAME ABAN Jan 28, 16 Jul 06, 17 [H01L]
2017/0186,607 METHOD OF FORMING A SEMICONDUCTOR DEVICE ABAN Dec 28, 15 Jun 29, 17 [H01L]
2017/0162,402 METHOD OF MANUFACTURING A SEMICONDUCTOR STRUCTURE ABAN Dec 07, 15 Jun 08, 17 [H01L]
2017/0125,583 HIGH VOLTAGE TRANSISTOR WITH SHORTENED GATE DIELECTRIC LAYER ABAN Nov 02, 15 May 04, 17 [H01L]
2017/0103,981 METHOD FOR FABRICATING CONTACTS TO NON-PLANAR MOS TRANSISTORS IN SEMICONDUCTOR DEVICE ABAN Oct 12, 15 Apr 13, 17 [H01L]
2017/0098,599 OXIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF ABAN Oct 01, 15 Apr 06, 17 [H01L]
2017/0098,696 SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME ABAN Nov 10, 15 Apr 06, 17 [H01L]
2017/0084,614 MEMORY CELL WITH OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR DEVICE INTEGRATED THEREIN ABAN Sep 17, 15 Mar 23, 17 [H01L]
2017/0062,615 METHOD OF FORMING SEMICONDUCTOR DEVICE ABAN Aug 27, 15 Mar 02, 17 [H01L]
2017/0047,251 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE INCLUDING FORMING A DIELECTRIC LAYER AROUND A PATTERNED ETCH MASK ABAN Aug 12, 15 Feb 16, 17 [H01L]
2017/0040,357 IMAGE SENSOR AND METHOD FOR FABRICATING THE SAME ABAN Oct 19, 15 Feb 09, 17 [H01L]
2017/0005,015 MONITOR PROCESS FOR LITHOGRAPHY AND ETCHING PROCESSES ABAN Jul 02, 15 Jan 05, 17 [H01L]
2016/0351,674 SEMICONDUCTOR STRUCTURE ABAN Aug 09, 16 Dec 01, 16 [H01L]
2016/0351,712 METHOD FOR INCREASING STRESS IN THE CHANNEL REGION OF FIN FIELD EFFECT TRANSISTOR ABAN Jun 30, 15 Dec 01, 16 [H01L]
2016/0334,208 OVERLAY MARK PATTERN AND METHOD OF MEASURING OVERLAY ABAN Jun 11, 15 Nov 17, 16 [G01B]
2016/0336,187 METHOD OF FORMING SEMICONDUCTOR STRUCTURE ABAN Jun 12, 15 Nov 17, 16 [H01L]
2016/0336,417 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME ABAN Jun 24, 15 Nov 17, 16 [H01L]

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