UNITED MICROELECTRONICS CORP.
Patent Owner
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- 0 4,011 US PATENTS IN FORCE
- 75 US APPLICATIONS PENDING
- Mar 20, 2018 most recent publication
Details
- 4,011 Issued Patents
- 12 Issued in last 3 years
- 0 Published in last 3 years
- 62,233 Total Citation Count
- Dec 17, 1987 Earliest Filing
- 2,581 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
MATTERS
Rank in Class
Intl Class
Technology
MATTERS
Rank in Class
- No Technologies to Display
Top Patents (by citation)
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Patent #
Title
Filing Date
Issue Date
Intl Class
CITATIONS
6174812
Copper damascene technology for ultra large scale integration circuits
Jun 08, 99
Jan 16, 01
[H01L]
271
5968610
Multi-step high density plasma chemical vapor deposition process
Oct 28, 97
Oct 19, 99
[B05D, H01L]
269
5378649
Process for producing non-volatile memory devices having closely spaced buried bit lines and non-overlapping code implant areas
Apr 08, 94
Jan 03, 95
[H01L]
218
5798298
Method of automatically generating dummy metals for multilevel interconnection
Feb 09, 96
Aug 25, 98
[H01L]
127
- No Patents to Display
Recent Publications
Publication #
Title
Filing Date
Pub Date
Intl Class
2018/0057,354
SEMICONDUCTOR SENSOR AND METHOD OF MANUFACTURING THE SAME
Oct 14, 16
Mar 01, 18
[B81C, B81B, G01N]
2018/0019,206
ELECTRIC FUSE STRUCTURE AND METHOD FOR FABRICATING THE SAME
Sep 26, 16
Jan 18, 18
[H01L]
2017/0365,675
DUMMY PATTERN ARRANGEMENT AND METHOD OF ARRANGING DUMMY PATTERNS
Jun 16, 16
Dec 21, 17
[H01L]
2017/0352,541
METHOD FOR FABRICATING A FIN FIELD EFFECT TRANSISTOR (FINFET)
Jun 02, 16
Dec 07, 17
[H01L]
2017/0345,926
HIGH-VOLTAGE METAL-OXIDE-SEMICONDUCTOR TRANSISTOR AND FABRICATION METHOD THEREOF
Jun 24, 16
Nov 30, 17
[H01L]
- No Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9922881
Method for fabricating semiconductor device structure and product thereof
Jan 12, 16
Mar 20, 18
[H01L]
- No Patents to Display
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2018/0033,636
METHOD OF FABRICATING A SEMICONDUCTOR STRUCTURE
Abandoned
Jul 27, 16
Feb 01, 18
[H01L]
2017/0222,026
METHOD OF FABRICATING FIN FIELD EFFECT TRANSISTOR
Abandoned
Feb 03, 16
Aug 03, 17
[H01L]
2017/0194,212
SEMICONDUCTOR DEVICE AND METHOD FOR FABRIACTING THE SAME
Abandoned
Jan 28, 16
Jul 06, 17
[H01L]
2017/0162,402
METHOD OF MANUFACTURING A SEMICONDUCTOR STRUCTURE
Abandoned
Dec 07, 15
Jun 08, 17
[H01L]
2017/0125,583
HIGH VOLTAGE TRANSISTOR WITH SHORTENED GATE DIELECTRIC LAYER
Abandoned
Nov 02, 15
May 04, 17
[H01L]
2017/0103,981
METHOD FOR FABRICATING CONTACTS TO NON-PLANAR MOS TRANSISTORS IN SEMICONDUCTOR DEVICE
Abandoned
Oct 12, 15
Apr 13, 17
[H01L]
2017/0098,599
OXIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
Abandoned
Oct 01, 15
Apr 06, 17
[H01L]
2017/0098,696
SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME
Abandoned
Nov 10, 15
Apr 06, 17
[H01L]
2017/0084,614
MEMORY CELL WITH OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR DEVICE INTEGRATED THEREIN
Abandoned
Sep 17, 15
Mar 23, 17
[H01L]
2017/0047,251
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE INCLUDING FORMING A DIELECTRIC LAYER AROUND A PATTERNED ETCH MASK
Abandoned
Aug 12, 15
Feb 16, 17
[H01L]
2017/0040,357
IMAGE SENSOR AND METHOD FOR FABRICATING THE SAME
Abandoned
Oct 19, 15
Feb 09, 17
[H01L]
2017/0005,015
MONITOR PROCESS FOR LITHOGRAPHY AND ETCHING PROCESSES
Abandoned
Jul 02, 15
Jan 05, 17
[H01L]
2016/0351,712
METHOD FOR INCREASING STRESS IN THE CHANNEL REGION OF FIN FIELD EFFECT TRANSISTOR
Abandoned
Jun 30, 15
Dec 01, 16
[H01L]
2016/0334,208
OVERLAY MARK PATTERN AND METHOD OF MEASURING OVERLAY
Abandoned
Jun 11, 15
Nov 17, 16
[G01B]
2016/0336,417
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
Abandoned
Jun 24, 15
Nov 17, 16
[H01L]
- No Patents to Display
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