VEECO INSTRUMENTS ACQUISITION CORP.

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
4949783 Substrate transport and cooling apparatus and method for sameExpiredMay 18, 88Aug 21, 90[C23C, F28F]
4860329 X-ray fluorescence thickness measuring deviceExpiredFeb 24, 86Aug 22, 89[G01B]
4707657 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machineExpiredAug 12, 85Nov 17, 87[G01R]
4646341 Calibration standard for X-ray fluorescence thicknessExpiredMar 28, 85Feb 24, 87[G01N, G01B, G01D]
4560464 Stick-on-mask for use with coulometric measuring instrumentsExpiredNov 21, 83Dec 24, 85[G01N]
4449048 Workpiece positioning system for beta ray measuring instrumentsExpiredSep 29, 82May 15, 84[G01N]
4437000 Aperture piece and method for calibrating backscatter thickness measuring instruments for measuring concave workpiecesExpiredMar 20, 81Mar 13, 84[G01N, G01D]
4343092 Probe guide and holderExpiredMar 17, 80Aug 10, 82[G01B]
4245189 Probe assembly for measuring conductivity of plated through holesExpiredJun 14, 79Jan 13, 81[G01R]
4229652 Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate materialExpiredJun 02, 78Oct 21, 80[G01N]
4190770 Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate materialExpiredNov 15, 77Feb 26, 80[G01N]
4184188 Substrate clamping technique in IC fabrication processesExpiredJan 16, 78Jan 15, 80[H02N]

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