Virginia Semiconductor, Inc.
Patent Owner
Stats
- 0 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Apr 29, 2003 most recent publication
Details
- 0 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 131 Total Citation Count
- Mar 01, 1995 Earliest Filing
- 11 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
- No Technology to Display
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Recent Publications
- No Recent Publications to Display
Recent Patents
- No Recent Patents to Display
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
6554687 Precise crystallographic-orientation alignment mark for a semiconductor waferExpiredSep 27, 01Apr 29, 03[B24C]
6057924 Optical system for measuring and inspecting partially transparent substratesExpiredSep 04, 98May 02, 00[G01B]
5959731 Optical micrometer for measuring thickness of transparent substrates based on optical absorptionExpiredOct 29, 97Sep 28, 99[G01B]
5754294 Optical micrometer for measuring thickness of transparent wafersExpiredMay 03, 96May 19, 98[G01B]
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