WYKO CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G01C MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 1104

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
5636013 Suspension assembly static attitude and distance measuring instrumentJan 04, 95Jun 03, 97[G01C, G01B]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
5822136 Friction connector for optical flats in interferometersExpiredDec 20, 96Oct 13, 98[G02B]
5813809 Polymeric insert with crush-formed threads for mating with threaded surfaceExpiredApr 28, 97Sep 29, 98[F16B, B25G]
5689337 Coaxial disc-mount for measuring flatness of computer-drive discs by interferometryExpiredAug 15, 96Nov 18, 97[G01B]
5680214 Horizontal-post/vertical-flexure arrangement for supporting large reference optics in phase-shifting scanningExpiredMar 22, 96Oct 21, 97[G01B]
5483064 Positioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopyExpiredJan 21, 94Jan 09, 96[H01J, G21K]
5200617 PMN translator and linearization system in scanning probe microscopeExpiredAug 13, 92Apr 06, 93[G01N]
5196713 Optical position sensor with corner-cube and servo-feedback for scanning microscopesExpiredMay 13, 92Mar 23, 93[G01J, G01N]
5173605 Compact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z controlExpiredMar 09, 92Dec 22, 92[G01N]
5116115 Method and apparatus for measuring corneal topographyExpiredMay 09, 90May 26, 92[A61B]
5103094 Compact temperature-compensated tube-type scanning probe with large scan rangeExpiredMay 02, 91Apr 07, 92[G01N]
5055695 Alignment system and method for infrared interferometerExpiredJun 28, 90Oct 08, 91[G01B]
4984893 Phase shifting device and methodExpiredDec 01, 89Jan 15, 91[G01B]
4639139 Optical profiler using improved phase shifting interferometryExpiredSep 27, 85Jan 27, 87[G01B]

Top Inventors for This Owner

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