X-FAB SEMICONDUCTOR FOUNDRIES AG

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 82281
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 6153
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 4443
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 3101
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2204
 
  
 
G11C STATIC STORES 2149
 
  
 
H01G CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE 264
 
  
 
H03K PULSE TECHNIQUE 2129
 
  
 
B81B MICRO-STRUCTURAL DEVICES OR SYSTEMS, e.g. MICRO-MECHANICAL DEVICES 132
 
  
 
B81C PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICRO-STRUCTURAL DEVICES OR SYSTEMS 131

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0068,872 Carrier Substrate For Semiconductor Structures Suitable For A Transfer By Transfer Print And Manufacturing Of The Semiconductor Structures On The Carrier SubstrateJul 13, 17Mar 08, 18[H01L]
2018/0045,764 SEMICONDUCTOR CIRCUITS, DEVICES AND METHODSAug 10, 17Feb 15, 18[G01R]
2017/0352,458 PLANAR COILJun 06, 17Dec 07, 17[G01R, H01F]
2017/0271,397 Anti-Reflective Treatment Of The Rear Side Of A Semiconductor WaferAug 08, 14Sep 21, 17[H01L]
2014/0367,796 MOS DEVICE ASSEMBLYNov 15, 11Dec 18, 14[H01L]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9875900 Method of fabricating a tunnel oxide layer and a tunnel oxide layer for a semiconductor deviceApr 13, 17Jan 23, 18[H01L]
9793338 Capacitor structures for semiconductor deviceJul 16, 10Oct 17, 17[H01L, H01G]
9748383 TransistorFeb 12, 09Aug 29, 17[H01L]
9653620 Semiconductor deviceNov 04, 15May 16, 17[H01L]
9627213 Method of fabricating a tunnel oxide layer and a tunnel oxide layer for a semiconductor deviceApr 05, 12Apr 18, 17[H01L]
9559170 Electrostatic discharge protection devicesMar 01, 12Jan 31, 17[H01L]
9543504 Vertical hall sensors with reduced offset errorOct 21, 15Jan 10, 17[H01L, G01R]
9524963 Semiconductor deviceMar 15, 13Dec 20, 16[H01L]
9496357 Semiconductor deviceJul 22, 11Nov 15, 16[H01L]
9331211 PN junctions and methodsAug 28, 09May 03, 16[H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0126,350 LDMOS TRANSISTORS FOR CMOS TECHNOLOGIES AND AN ASSOCIATED PRODUCTION METHODAbandonedDec 16, 15May 05, 16[H01L]
2014/0183,618 SEMICONDUCTOR DEVICEAbandonedAug 05, 11Jul 03, 14[H01L]
2013/0093,015 HIGH VOLTAGE MOS TRANSISTORAbandonedMar 01, 10Apr 18, 13[H01L]
2011/0182,324 OPERATING TEMPERATURE MEASUREMENT FOR AN MOS POWER COMPONENT, AND MOS COMPONENT FOR CARRYING OUT THE METHODAbandonedMay 19, 09Jul 28, 11[G01K, H01L]
2011/0012,236 EVALUATION OF AN UNDERCUT OF DEEP TRENCH STRUCTURES IN SOI WAFERSAbandonedJan 19, 07Jan 20, 11[H01L]
2010/0330,506 METHOD FOR TRANSFERRING AN EPITAXIAL LAYER FROM A DONOR WAFER TO A SYSTEM WAFER APPERTAINING TO MICROSYSTEMS TECHNOLOGYAbandonedJul 18, 08Dec 30, 10[G03F]
2010/0311,248 STRUCTURED LAYER DEPOSITION ON PROCESSED WAFERS USED IN MICROSYSTEM TECHNOLOGYAbandonedJun 16, 08Dec 09, 10[H01L, B05C]
2010/0282,165 PRODUCTION OF ADJUSTMENT STRUCTURES FOR A STRUCTURED LAYER DEPOSITION ON A MICROSYSTEM TECHNOLOGY WAFERAbandonedJun 16, 08Nov 11, 10[C23C, C23F]
2010/0252,880 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE, AND A SEMICONDUCTOR DEVICEAbandonedJul 18, 08Oct 07, 10[H01L]
7790569 Production of semiconductor substrates with buried layers by joining (bonding) semiconductor wafersExpiredNov 29, 04Sep 07, 10[H01L]
2010/0213,545 MOS TRANSISTOR WITH A P-FIELD IMPLANT OVERLYING EACH END OF A GATE THEREOFAbandonedMay 15, 08Aug 26, 10[H01L]
2010/0155,910 METHOD FOR THE SELECTIVE ANTIREFLECTION COATING OF A SEMICONDUCTOR INTERFACE BY A PARTICULAR PROCESS IMPLEMENTATIONAbandonedJun 16, 07Jun 24, 10[H01L]
2010/0148,255 LATERAL HIGH-VOLTAGE MOS TRANSISTOR WITH A RESURF STRUCTUREAbandonedMar 26, 08Jun 17, 10[H01L]
2010/0059,851 CMOS CIRCUITS COMBINING HIGH VOLTAGE AND RF TECHNOLOGIESAbandonedJun 27, 07Mar 11, 10[H01L]
2009/0309,190 SEMICONDUCTOR PROCESSINGAbandonedMay 11, 07Dec 17, 09[H01L]
2009/0294,893 ISOLATION TRENCH INTERSECTION STRUCTURE WITH REDUCED GAP WIDTHAbandonedDec 08, 06Dec 03, 09[H01L]
2009/0250,724 BIPOLAR TRANSISTOR AND METHOD OF MAKING SUCH A TRANSISTORAbandonedDec 14, 05Oct 08, 09[H01L]
7598098 Monitoring the reduction in thickness as material is removed from a wafer composite and test structure for monitoring removal of materialExpiredApr 16, 04Oct 06, 09[H01L]
2009/0180,188 BROADBAND ANTIREFLECTIVE OPTICAL COMPONENTS WITH CURVED SURFACES AND THEIR PRODUCTIONAbandonedMar 23, 07Jul 16, 09[G02B]
2009/0174,418 Method and Device for Electrically Determining the Thickness of Semiconductor Membranes by Means of an Energy InputAbandonedOct 20, 05Jul 09, 09[G01R]

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