Xandex, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 8151
 
  
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 397
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361
 
  
 
H01P WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE 159
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 1132
 
  
 
H02J CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY 1119
 
  
 
H02M APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF 1101
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 1155

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8916764 Output voltage ripple control for a DC-DC power converterMay 05, 11Dec 23, 14[H02M, G05F]
8525503 Hybrid rectifierMay 02, 11Sep 03, 13[G05F]
8273979 Time averaged modulated diode apparatus for photovoltaic applicationMay 01, 09Sep 25, 12[H02J, H01L, G05F]
7358754 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentJun 30, 06Apr 15, 08[G01R]
7295024 Contact signal blocks for transmission of high-speed signalsJan 25, 06Nov 13, 07[G01R]
7078890 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentJul 25, 05Jul 18, 06[H05K]
6963211 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentOct 13, 04Nov 08, 05[G01R]
6888427 Flex-circuit-based high speed transmission lineFeb 11, 03May 03, 05[H01P]
6833696 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentDec 01, 03Dec 21, 04[G01R]
6166553 Prober-tester electrical interface for semiconductor testJun 29, 98Dec 26, 00[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2008/0030,211 ACTIVE PROBE CONTACT ARRAY MANAGEMENTAbandonedOct 10, 07Feb 07, 08[G01R]
2008/0030,212 ACTIVE PROBE CONTACT ARRAY MANAGEMENTAbandonedOct 10, 07Feb 07, 08[G01R]
2008/0030,213 ACTIVE PROBE CONTACT ARRAY MANAGEMENTAbandonedOct 10, 07Feb 07, 08[G01R]
2008/0025,012 CONTACT SIGNAL BLOCKS FOR TRANSMISSION OF HIGH-SPEED SIGNALSAbandonedOct 03, 07Jan 31, 08[H01R, G01R]
2007/0176,615 Active probe contact array managementAbandonedMay 15, 06Aug 02, 07[G01R]
2007/0126,439 METHODS AND APPARATUS FOR CREATING A HIGH SPEED CONNECTION BETWEEN A DEVICE UNDER TEST AND AUTOMATIC TEST EQUIPMENTAbandonedOct 11, 06Jun 07, 07[G01R]
5471148 Probe card changer system and methodExpiredJan 28, 94Nov 28, 95[G01R]
5254939 Probe card systemExpiredMar 20, 92Oct 19, 93[G01R]

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