XCERRA CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 12161
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 26421
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 18115
 
  
 
H03K PULSE TECHNIQUE 11120
 
  
 
G11C STATIC STORES 5146
 
  
 
H03L AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES 575
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 5151
 
  
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 452
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 4281
 
  
 
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 364

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9875954 Test socket assembly and related methodsJun 18, 15Jan 23, 18[H01L, G01R, H05K]
9829506 Test probe assembly and related methodsMar 14, 13Nov 28, 17[G01R]
9753058 Wiring board for testing loaded printed circuit boardOct 30, 14Sep 05, 17[G01R]
9720032 Automated test platform for testing short circuitsMar 31, 15Aug 01, 17[G01R]
9554486 Heat dissipation systemFeb 20, 14Jan 24, 17[G06F, H05K]
9521175 Media taggingOct 05, 12Dec 13, 16[H04L, G10L, G06F, G06K]
9459978 Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under testJan 24, 13Oct 04, 16[G06F]
9430348 Scalable test platform in a PCI express environment with direct memory accessJan 24, 13Aug 30, 16[G06F]
9430349 Scalable test platform in a PCI express environment with direct memory accessJan 24, 13Aug 30, 16[G06F]
9425529 Integrated circuit chip tester with an anti-rotation linkJun 20, 14Aug 23, 16[H01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0316,608 DEBUGGING SYSTEM AND METHODAbandonedMay 01, 15Nov 05, 15[G01R]
2015/0316,609 DEBUGGING SYSTEM AND METHODAbandonedMay 01, 15Nov 05, 15[G01R]
2015/0316,610 DEBUGGING SYSTEM AND METHODAbandonedMay 01, 15Nov 05, 15[G01R]
2015/0316,611 DEBUGGING SYSTEM AND METHODAbandonedMay 01, 15Nov 05, 15[G01R]
2015/0316,614 DEBUGGING SYSTEM AND METHODAbandonedMay 01, 15Nov 05, 15[G01R]
8449002 Closure mechanism for pressure test chambers for testing electronic components, in particular ICsExpiredJul 01, 08May 28, 13[E05B, B65D]
2013/0069,685 INTEGRATED CIRCUIT TEST SOCKET HAVING TEST PROBE INSERTSAbandonedSep 14, 12Mar 21, 13[G01R]
2011/0273,203 METHOD FOR THE TESTING OF CIRCUIT BOARDSAbandonedJan 13, 10Nov 10, 11[G01R]
7946405 Guide path for electronic componentsExpiredDec 06, 07May 24, 11[B65G]
7810005 Method and system for correcting timing errors in high data rate automated test equipmentExpiredOct 31, 07Oct 05, 10[G06F]
2010/0206,768 DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATED SEMICONDUCTOR COMPONENTS IN RECEIVING POCKETS OF A TERMINAL CARRIERAbandonedFeb 12, 09Aug 19, 10[H01L, G01R, B65D]
2010/0209,864 TEMPERING CHAMBER FOR TEMPERING ELECTRONIC COMPONENTS IN PARTICULAR IC'SAbandonedSep 25, 08Aug 19, 10[F27B]
7761751 Test and diagnosis of semiconductorsExpiredFeb 20, 07Jul 20, 10[G06F, G01R]
7677383 Guide path for electronic componentsExpiredNov 30, 06Mar 16, 10[B65G]
7664621 System and method for mapping system transfer functionsExpiredMay 09, 08Feb 16, 10[G06F, G01R]
2010/0023,294 AUTOMATED TEST SYSTEM AND METHODAbandonedAug 28, 08Jan 28, 10[G01R]
7627790 Apparatus for jitter testing an ICExpiredNov 18, 04Dec 01, 09[H03L, H04L, H04Q, H04B, G06F, G04F, G01R, H03H, G04G, G06K]
7581410 Low temperature testing device for electronic componentsExpiredJul 19, 05Sep 01, 09[F25D]
7471753 Serializer clock synthesizerExpiredFeb 01, 05Dec 30, 08[H04L]
7424775 Captive wired test fixtureExpiredMar 09, 06Sep 16, 08[B23P]

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