n&k Technology, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS1386
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 13193
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1068
 
  
 
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 265
 
  
 
B07C POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING 126
 
  
 
B23B TURNING; BORING 151
 
  
 
B65B MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGING ARTICLES OR MATERIALS; UNPACKING 163
 
  
 
G01G WEIGHING 127
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9513112 Three dimensional characterization of silicon wafer Vias from combined on-top microscopic and bottom-through laser fringes measurementAug 22, 14Dec 06, 16[G01B]
8125641 Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES)Mar 27, 09Feb 28, 12[G01J]
7999936 Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle densityApr 02, 09Aug 16, 11[G01N]
7962242 Automated spatial flipping apparatus and system for photomasks and photomasks with pelliclesMar 18, 08Jun 14, 11[B65G, B25J]
7755775 Broadband optical metrology with reduced wave front distortion, chromatic dispersion compensation and monitoringOct 03, 06Jul 13, 10[G01J, G01B]
7756677 Implementation of rigorous coupled wave analysis having improved efficiency for characterizationAug 28, 07Jul 13, 10[G06F]
7717661 Compact multiple diameters wafer handling system with on-chuck wafer calibration and integrated cassette-chuck transferMay 25, 06May 18, 10[G01N, B65G, G01B, B65B]
7679736 System and method for optical photomask inspection through pellicleJul 26, 08Mar 16, 10[G01N]
7616301 Disc clamping device for multiple standard discsMar 03, 04Nov 10, 09[G01N]
7525672 Efficient characterization of symmetrically illuminated symmetric 2-D gratingsDec 16, 05Apr 28, 09[G01B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2005/0111,944 Compact wafer handling system with single axis robotic arm and prealigner-cassette elevatorAbandonedNov 25, 03May 26, 05[B65G, B65B]

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