Aviv Frommer

Inventor

Create Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
LUCENT TECHNOLOGIES INC.
1
1997
LYNX PHOTONIC NETWORKS INC.
3
2002
KLA-TENCOR TECHNOLOGIES CORPORATION
6
2006

Inventor Addresses

AddressDuration
D. N. Misgav, ILJul 26, 07 - Jul 26, 07
D.N. Misgav, ILSep 07, 06 - Mar 23, 10
Haifa, ILAug 17, 99 - Aug 17, 99
Misgav, ILAug 28, 03 - Apr 28, 09

Technology Profile

Technology # of Patents
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 3
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G02B: OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 3

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
7,684,0392010Overlay metrology using the near infra-red spectral range0
7,528,9532009Target acquisition and overlay metrology based on two diffracted orders imaging0
7,526,7492009Methods and apparatus for designing and using micro-targets in overlay metrology0
2007/0187,6062007OVERLAY METROLOGY USING THE NEAR INFRA-RED SPECTRAL RANGE2
2007/0171,7492007DEVICE HAVING AN ARRAY OF NON-VOLATILE MEMORY CELLS AND A METHOD FOR ALTERING A STATE OF A NON-VOLATILE MEMORY CELL2

See more…

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.