Richard F Herlein

Inventor

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Work History

Patent OwnerApplications FiledYear
NATIONAL SEMICONDUCTOR CORPORATION
2
1
1984
1987
Fairchild Camera & Instrument Corp.
2
1
1984
1987
SCHLUMBERGER SYSTEMS AND SERVICES, INC.
2
1
1
1984
1986
1987
XCERRA CORPORATION
1
1993
SCHLUMBERGER TECHNOLOGIES, INC.
1
1
1987
1988
CREDENCE SYSTEMS CORPORATION
1
1993

Inventor Addresses

AddressDuration
San Jose, CAJan 06, 87 - Jul 04, 95

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2
G06K: RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 2
H03K: PULSE TECHNIQUE 6

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
54304001995Driver circuits for IC tester36
48497021989Test period generator for automatic test equipment36
48375211989Delay line control system for automatic test equipment10
48209441989Method and apparatus for dynamically controlling the timing of signals in automatic test systems24
47898351988Control of signal timing apparatus in automatic test systems using minimal memory15

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