Daichi Kamisono

Inventor

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Work History

Patent OwnerApplications FiledYear
OMRON CORPORATION
2
2
2010
2013

Inventor Addresses

AddressDuration
Ritto, JPSep 19, 13 - Apr 14, 15
Ritto-shi, JPFeb 09, 12 - Feb 09, 12

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
9,007,0562015Monitoring device and monitoring method for rotary encoder0
8,779,7782014Proximity switch0
2013/0241,5702013Monitoring device and monitoring method for rotary encoder0
2012/0032,6902012PROXIMITY SWITCH0


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