Jun Sik Lee

Inventor

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Work History

Patent OwnerApplications FiledYear
SNU R&DB FOUNDATION
2
2009
SAMSUNG ELECTRONICS CO., LTD.
2
2009
HYNIX SEMICONDUCTOR INC.
1
2
2005
2007
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
4
2
2000
2004
LG SEMICON CO., LTD.
1
1998

Inventor Addresses

AddressDuration
Cheongju-si, KRJan 01, 09 - Aug 27, 13
Chungcheongbuk-do, KRJun 20, 00 - Aug 09, 05
Chungecheongbuk-do, KRJun 29, 06 - Jun 29, 06
Seoul, KRDec 31, 09 - Nov 04, 14
Sungwoon APT., 102-805, 660-44, Yuiryang-dong, Sangdang-ku, Cheongju-si, Chungcheongbuk-do, KRMar 30, 04 - Mar 30, 04

Technology Profile

Technology Matters
B08B: CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 1
B44C: PRODUCING DECORATIVE EFFECTS 1
G03F: PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
8,879,7382014System and method of updating key based on communication cost and security damage cost0
8,518,6102013Method for fabricating photomask0
2009/0323,9642009SYSTEM AND METHOD OF UPDATING KEY BASED ON COMMUNICATION COST AND SECURITY DAMAGE COST2
2009/0004,5742009METHOD FOR FABRICATING PHOTOMASK0
2006/0137,7172006Method for removing impurities grown on a phase shift mask4

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