Frank J McEnroe

Inventor

Follow

Stats

Details

Work History

Patent OwnerApplications FiledYear
PHILLIPS 66 COMPANY
2
2008
CONOCOPHILLIPS COMPANY
4
2010

Inventor Addresses

AddressDuration
Ponca City, OK, USNov 12, 09 - Oct 23, 12

Technology Profile

Technology # of Patents
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 5
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
8,294,8922012On-line/at-line monitoring of residual chemical by surface enhanced Raman spectroscopy0
7,982,8722011Residual chemical monitoring system using surface enhanced raman spectroscopy1
2011/0043,8002011Residual Chemical Monitoring System Using Surface Enhanced Raman Spectroscopy0
2011/0007,3102011On-Line/At-Line Monitoring of Residual Chemical by Surface Enhanced Raman Spectroscopy0
7,782,4482010Analysis of the effects of a first substance on the behavior of a second substance using surface enhanced Raman spectroscopy0

See more…