Dominik J Schmidt

Inventor

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Details

Work History

Patent OwnerApplications FiledYear
INTELLECTUAL VENTURES I LLC
1
1
28
6
3
4
4
14
2
2
1
1
1996
1997
2001
2002
2003
2004
2005
2006
2007
2010
2012
2013
INTEL CORPORATION
3
2006
SECURE AXCESS LLC
2
2
2
2001
2004
2006
ALTERA CORPORATION
1
2
1
2
1997
1998
2002
2003
AIRIFY COMMUNICAITON INC.
2
2007
PHOTO OPTO ELECTRONIC TECHNOLOGIES
1
1
1996
1997
AIRIFY COMMUNICATIONS, INC.
1
2004

Inventor Addresses

AddressDuration
580 Arastradero Rd.Oct 27, 09 - Mar 23, 10
Palo Alto, CASep 17, 02 - Dec 09, 08
Palo Alto, CA, USSep 12, 02 - Aug 29, 13
San Francisco, CA, USMar 22, 11 - Mar 22, 11
San Jose, CAAug 24, 99 - Sep 13, 05
San Jose, CA, USDec 13, 01 - Jan 29, 04
Stanford, CAJul 22, 04 - May 27, 08
Stanford, CA, USAug 04, 09 - Jul 05, 12

Technology Profile

Technology # of Patents
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 2
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2013/0223,4182013RF Sniffer0
2012/0173,8642012FLEXIBLE MULTI-PROCESSING SYSTEM0
8,090,9282012Methods and apparatus for processing scalar and vector instructions1
8,005,0532011Channel interference reduction0
7,924,8782011Flexible processing system0

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