David Michael Williamson

Inventor

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Work History

Patent OwnerApplications FiledYear
NIKON CORPORATION
2
1
2011
2012

Inventor Addresses

AddressDuration
Tucson, AZ, USJul 26, 12 - Jan 03, 13

Technology Profile

Technology # of Patents
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G02B: OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2013/0003,1662013Full-field maskless lithography projection optics0
2012/0224,1722012Optical components for use in measuring projection lens distortion or focus of an optical imaging system that images a substrate0
2012/0188,5572012Apparatus, optical assembly, method for inspection or measurement of an object and method for manufacturing a structure0

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