Akira Yamaguchi

Inventor

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Work History

Patent OwnerApplications FiledYear
SEIREN CO., LTD.
2
2009
SONY CORPORATION
2
1
1
3
3
2
2
3
7
10
7
4
4
2
2
2
1
2
1
1996
1997
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2010
2011
2012
2013
2015
2016
PANASONIC CORPORATION
2
2
2
2005
2011
2012
KDDI CORPORATION
1
1
1
1
1
4
2
1994
1995
1996
1997
1999
2001
2002
FUJI PHOTO FILM CO., LTD.
1
2
1
2
4
1
2
2
4
8
14
10
7
9
5
1983
1985
1986
1987
1988
1991
1992
1998
1999
2000
2001
2003
2004
2005
2006
HITACHI, LTD.
2
2001
KDD Corporation
1
2000
MIKUNI CORPORATION
4
2005
YAMAHA HATSUDOKI KABUSHIKI KAISHA
1
2
1994
2006
SUMITOMO SEIKA CHEMICALS CO., LTD.
1
1991
KABUSHIKI KAISHA TOSHIBA
1
1
1
1
1
1
1
1
1
2
2
4
2
4
3
1
1984
1985
1987
1988
1989
1991
1992
1997
1998
1999
2000
2001
2002
2003
2004
2010
EAGLE NEW MEDIA INVESTMENTS, LLC
2
2001
TOYOTA JIDOSHA KABUSHIKI KAISHA
1
1
1
2
2
1993
1994
1995
2006
2010
SCREEN HOLDINGS CO., LTD.
2
2006
NIKON CORPORATION
1
1
2013
2015
TN EMC LTD.
1
2012
SANYO SPECIAL STEEL CO., LTD.
1
1989
MITSUBISHI STEEL MFG. CO., LTD.
2
2010
Myotoku Ltd.
1
3
1985
1988
TOHOKU TECHNO ARCH CO., LTD.
2
2003
SUMITOMO ELECTRIC INDUSTRIES, LTD.
1
1
1
2
2
13
2
4
1995
1997
2000
2001
2002
2003
2004
2005
FUJI DIE CO., LTD.
1
1989
KDDI R&D Laboratories Inc.
2
2009
DENSO CORPORATION
3
2
2
4
1
2000
2002
2004
2005
2009
Co-Op Chemical Co. Ltd.
1
1995
CREATIVE PRODUCTS INC.
1
1988
HITACHI PLANT TECHNOLOGIES, LTD.
1
1995
TOYO BOSEKI KABUSHIKI KAISHA
1
1995
Orihiro Engineering Co., Ltd.
1
2009
NISSHINBO INDUSTRIES, INC.
3
3
2
1
1997
2001
2002
2006
ORIHIRO CO., LTD.
1
2006
PANASONIC HEALTHCARE HOLDINGS CO., LTD.
2
2005
MEMC ELECTRONIC MATERIALS, INC.
1
1994
FUJIFILM CORPORATION
3
1
2
2
4
8
12
10
7
9
8
2
2
1988
1991
1992
1998
1999
2000
2001
2003
2004
2005
2006
2012
2015
DISCO CORPORATION
1
2013
ISHIKAWA, TAKAHIRO
1
2004
NOK CORPORATION
1
1
2
2
4
1999
2000
2005
2007
2011
TDK CORPORATION
3
7
2004
2006
Daiwa Seiko, Inc.
1
1
1
1
4
2
3
6
1
1
2
1988
1989
1992
1993
1994
1995
1996
1997
1998
1999
2000
ADVANCED TELECOMMUNICATIONS RESEARCH INSTITUTE INTERNATIONAL
2
2007
Obayashi Corporation
1
2004
JFE STEEL CORPORATION
1
2004
NEC CORPORATION
1
2003
Sanyo Aqua Corporation
1
2011
DDI CORPORATION
2
2001
TAIYO NIPPON SANSO CORPORATION
1
2
3
2010
2012
2013
SCREEN SEMICONDUCTOR SOLUTIONS CO., LTD.
2
2
2
2008
2012
2014
SHARP KABUSHIKI KAISHA
1
1
1
1
1
2
2
1984
1985
1987
1992
1993
2003
2005
RIKEN
1
2015
Tokyo Shibaura Denki Kabushiki Kaisha
2
1
1982
1983
TAIYO NIPPON SANSO CORPORATION et al.
1
2013
FANUC CORPORATION
2
2
1
2013
2015
2016
NIPPON CHEMICAL INDUSTRIAL CO., LTD.
1
1981
TOKYO SEIMITSU CO., LTD.
2
1
2014
2016
NISSAN MOTOR CO., LTD.
4
1
2005
2014
Pioneer Electronic Corporation
1
1995
TNCSE Ltd.
1
3
2010
2013
FANUC LTD
1
1
2004
2005
SANYO ELECTRIC CO., LTD.
1
1
2008
2011
SOKUDO CO., LTD.
2
1
2007
2008
CHICAGO MERCANTILE EXCHANGE INC.
2
2
2014
2015
SANYO ELECTRIC TECHNO CREATE CO., LTD.
1
2008
Takara Belmont Corporation
1
2011
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
2
2012
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1
1
1
1997
1999
2005

Inventor Addresses

AddressDuration
74-9, 1864-7, Shiroyma-cho, Kasugai-shi, Aichi-ken, JPFeb 24, 81 - Feb 24, 81
Asaka, JPSep 23, 86 - Nov 08, 88
Ashigarakami-gun, JPSep 22, 05 - Dec 27, 16
Chicago, IL, USJan 22, 15 - Jan 07, 16
Chiryu, JPJun 04, 02 - Apr 06, 10
Chiryu-city, JPJun 12, 03 - Jan 28, 10
Chiyoda-machi, JPJun 17, 97 - Jun 17, 97
Chuo-ku, JPJan 05, 10 - Jan 05, 10
FUKUSHIMA, JPJan 10, 02 - Jan 10, 02
Fujimino, JPMar 05, 13 - Mar 05, 13
Fujimino-shi, JPJul 01, 10 - Jul 01, 10
Fukui, JPAug 14, 08 - Oct 20, 15
Fukui-city, JPDec 21, 06 - Dec 21, 06
Fukuroi, JPNov 20, 07 - Nov 20, 07
Fukuroi-shi, JPSep 21, 06 - Sep 21, 06
Fukushim, JPAug 21, 01 - Aug 21, 01
Fukushima, JPJun 29, 99 - Feb 28, 17
Fukushima-shi, JPApr 05, 12 - Apr 12, 12
Higashikurume, JPOct 01, 96 - Oct 26, 99
Hino, JPApr 11, 95 - Oct 04, 11
Hirakata, JPMar 21, 00 - Apr 10, 01
Hyogo, JPApr 17, 90 - Feb 02, 93
Ichihara, JPJul 15, 14 - Jul 15, 14
Ichihara-shi, JPSep 06, 12 - Sep 06, 12
Iruma, JPJun 16, 98 - May 01, 01
Itami, JPOct 27, 98 - Apr 02, 02
Iwata, JPMay 14, 96 - May 14, 96
Iwate, JPSep 01, 05 - Aug 26, 08
KANAGAWA-KEN, JPAug 14, 03 - Aug 14, 03
Kaisei-machi, JPMar 01, 05 - Mar 01, 05
Kanagawa, JPNov 21, 89 - Jan 19, 17
Kanagawa-ken, JPFeb 27, 01 - May 24, 11
Kasugai, JPFeb 22, 83 - Feb 22, 83
Kawagoe-shi, JPJan 03, 02 - May 17, 07
Kawaguchi, JPJan 02, 14 - Sep 17, 15
Kitaadachi-gun, JPJan 03, 02 - Oct 17, 06
Kyoto, JPJul 05, 94 - Feb 28, 17
Matsusaka, JPJul 05, 11 - Jul 05, 11
Matsusaka-shi, JPFeb 28, 08 - Feb 28, 08
Minamitsuru-gun, JPAug 26, 04 - Feb 23, 06
Nara, JPJun 09, 87 - Jun 05, 07
Nara-shi, JPDec 18, 03 - Dec 18, 03
Niigata, JPOct 22, 96 - Oct 22, 96
Ora-gun, JP -
Osaka, JPSep 26, 02 - Nov 29, 16
Oura-gun, JPOct 06, 11 - Oct 06, 11
Saitama, JPMar 20, 84 - Jul 28, 11
Saitama-ken, JPJul 08, 97 - Jul 08, 97
Shimogyo-ku, JPAug 28, 08 - Mar 20, 12
Soraku-gun, JPMay 06, 97 - Jan 17, 08
Tagajyou, JPFeb 24, 04 - Feb 24, 04
Tagajyou-shi, JPSep 25, 03 - Sep 25, 03
Takasaki, JPJun 28, 16 - Jun 28, 16
Takasaki-shi, JPFeb 18, 10 - Feb 18, 10
Takefu, JPJan 02, 07 - Jan 02, 07
Tokorozawa, JPSep 13, 11 - Sep 13, 11
Tokorozawa-shi, JPJan 31, 08 - Jan 31, 08
Tokyo, JPAug 18, 87 - Jan 12, 17
Utsunomiya, JPAug 08, 95 - Aug 08, 95
Yamanashi, JPOct 17, 13 - Aug 18, 16
Yokohama, JPJul 16, 85 - Jun 02, 05
Yokohama-shi, JPFeb 14, 02 - Aug 14, 03
c/o Daiwa Seiko, Inc., No. 3-14-16, Maesawa, Higashikurume-shi, Tokyo, JPJun 19, 90 - Jun 19, 90

Technology Profile

Technology Matters
A01K: ANIMAL HUSBANDRY; CARE OF BIRDS, FISHES, INSECTS; FISHING; REARING OR BREEDING ANIMALS, NOT OTHERWISE PROVIDED FOR; NEW BREEDS OF ANIMALS 16
A45D: HAIRDRESSING OR SHAVING EQUIPMENT; MANICURING OR OTHER COSMETIC TREATMENT 1
A47C: CHAIRS 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
95837912017Electrolytic solution and battery0
95819072017Developing apparatus0
2017/0015,1662017SUSPENSION STRUCTURE FOR VEHICLE0
2017/0010,3232017Semiconductor Wafer Inspection Apparatus And Semiconductor Wafer Inspection Method0
95319502016Imaging system and imaging method that perform a correction of eliminating an influence of ambient light for measurement data0

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