Selective plane illumination microscopy (SPIM) systems and methods
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United States of America Patent
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Nov 27, 2018
Grant Date -
Oct 12, 2017
app pub date -
Oct 2, 2015
filing date -
Oct 2, 2014
priority date (Note) -
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Abstract
In one embodiment, a selective plane illumination microscopy system for capturing light emitted by an illuminated specimen includes a specimen stage having a top surface adapted to support a specimen holder and an opening adapted to provide access to a bottom of the holder, and a selective plane illumination microscopy optical system positioned beneath the stage, the optical system including an excitation objective, a detection objective, and an open-top, hollow prism that is adapted to contain a liquid, wherein the prism is positioned within the opening of the stage and optical axes of the objectives are aligned with the prism such that the axes pass through the prism and intersect at a position near the top surface of the specimen stage.
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