Sampling location displaying apparatus and sampling method
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United States of America Patent
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Jun 25, 2019
Grant Date -
Jan 12, 2017
app pub date -
Jun 16, 2014
filing date -
Mar 31, 2014
priority date (Note) -
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status (Latency Note)
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Abstract
According to the sampling method of the aspect of the present invention, the coordinate (location information) of the sampling location on the sampling specimen is generated randomly by the controller, such as a personal computer, of the sampling location display. Based on the location information, the sampling location is displayed on the sampling specimen, which is a part of the recycled raw material, by laser light. Because of this, arbitrariness, in which the operator artificially selects the sampling location, during incremental sampling for setting the average quality of the sampling specimen, such as the average content of valuable metal, can be excluded reliably.
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