Methods and apparatus for waveguide metrology
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United States of America Patent
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Jun 8, 2021
Grant Date -
May 7, 2020
app pub date -
Oct 31, 2019
filing date -
Nov 7, 2018
priority date (Note) -
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Abstract
Embodiments described herein relate to apparatus for measuring and characterizing performance of augmented and virtual reality waveguide structures utilizing glass substrates. The waveguide performance measuring systems generally include a light source configured to direct light towards an incoupling grating area on waveguide and one or more light detectors configured to collect light from an outcoupling grating area on a second side of the waveguide. The light source and one or more light detectors are disposed on one or more adjustable stages positioned about the waveguide. In certain embodiments, the one or more adjustable stages are configured to move in a linear fashion or revolve and/or rotate around the waveguide in an orbital motion.
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