Scanning sensor having a spin defect

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 11293940
APP PUB NO 20210140996A1
SERIAL NO

16492259

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Abstract

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A sensor device includes a carrier, a force feedback sensor, and a probe containing a spin defect, the probe being connected to the force feedback sensor either directly or indirectly via a handle structure. In order to couple the spin defect to a microwave field in an efficient and robust manner, the sensor device includes an integrated microwave antenna arranged at a distance of less than 500 micrometers from the spin defect. The sensor device can be configured as a self-contained exchangeable cartridge that can easily be mounted in a sensor mount of a scanning probe microscope.

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Patent Owner(s)

Patent OwnerAddress
ETH ZURICHETH TRANSFER RAEMISTRASSE 101 ZURICH 8092

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Boss, Jens Lucerne, CH 1 2
Chang, Kevin Zurich, CH 66 659
Degen, Christian Zurich, CH 2 6
Rhensius, Jan Dubendorf, CH 1 2

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