Building inspection and measurement device
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United States of America Patent
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-
Jul 5, 2022
Grant Date -
Jun 11, 2020
app pub date -
Dec 5, 2019
filing date -
Dec 7, 2018
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An inspection and measurement device includes a body defining a first planar face within a first bounded area, a first reference feature disposed on the first planar face within the first bounded area and corresponding with a first measurable parameter, and at least a second reference feature disposed on the first planar face within the first bounded area and corresponding with a second measurable parameter. The first and second reference features are positioned within the first bounded area for placement adjacent an element bearing the respective one of the first and second measurable parameters. The first and second reference features overlap within the first bounded area in at least one direction.
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Family
International Classification(s)
Cited Art Landscape
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