Quantum efficiency measuring instrument and method for photovoltaic detectors on individual laser pulses
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United States of America Patent
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Sep 6, 2022
Grant Date -
Nov 7, 2019
app pub date -
May 3, 2019
filing date -
May 4, 2018
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Abstract
Provided are an apparatus and method for measuring quantum efficiency of a detector using a single pulse laser. Quantum efficiency of the measurement target detector may be measured from 420 nm to 1600 nm having uncertainty of 2% to 4% (K=2) by comparing the reference detector and the measurement target detector significantly different in sensitivity using a single laser pulse as a spectral light source. Also, it is possible to directly compare the two detectors with a significant difference in sensitivity through a very simple setup that causes a portion of a laser pulse output from a light source part to be absorbed by the reference detector and the laser pulse reflected from the reference detector to be irradiated to the measurement target detector.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE | 267 GAJEONG-RO YUSEONG-GU DAEJEON 34113 |
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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Hong, Kee-Suk | Daejeon, KR | 2 | 3 |
Hwang, Jisoo | Daejeon, KR | 8 | 7 |
Lee, Dong-Hoon | Daejeon, KR | 224 | 2118 |
Park, Seongchong | Daejeon, KR | 8 | 21 |
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