Test device
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United States of America Patent
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Aug 15, 2023
Grant Date -
Jul 7, 2022
app pub date -
Mar 28, 2022
filing date -
Nov 30, 2017
priority date (Note) -
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status (Latency Note)
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Abstract
A test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.
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