Testing apparatus and testing method

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12146131
APP PUB NO 20220145233A1
SERIAL NO

17436396

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Abstract

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Provided is a technique for preventing erroneous recognition of a fine particle region from a captured image of fine particles. A fine particle testing apparatus of the present disclosure includes: an imaging part capturing a first fine particle image of a well that holds a liquid containing fine particles; an image processor executing a process of generating a second fine particle image by extracting a contour of the first fine particle image, a process of performing a logical operation between the first fine particle image and the second fine particle image, a process of calculating a feature amount of the fine particles based on a result of the logical operation, and a process of determining growth of the fine particles in the well based on the calculated feature amount; and an output part outputting a result of the determination.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATION17-1 TORANOMON 1-CHOME MINATO-KU TOKYO 105-6409

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujita, Hiroko Tokyo, JP 12 102
Koide, Tetsushi Hiroshima, JP 25 216
Masuya, Akira Tokyo, JP 14 9
Sugiyama, Kiyotaka Tokyo, JP 6 9
Uematsu, Chihiro Tokyo, JP 44 428

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