Method of characterizing an optical sensor chip, method of calibrating an optical sensor chip, method of operating an optical sensor device, optical sensor device and calibration system

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United States of America

PATENT NO 12196614
APP PUB NO 20220065695A1
SERIAL NO

17312999

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Abstract

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Disclosed are methods and devices for calibration in the field of optical sensors, e.g. characterizing and calibrating an optical sensor chip. In order to address complexity of sensor data with high accuracy the optical sensor, e.g. an optical sensor is not provided as an already calibrated unit. Rather, sensor response data may be recorded in a defined or standardized environment, e.g. at a production line, and with high precision. This high standard sensor response data can be obtained on a per device basis and, thus, is referenced with an unambiguous chip identification number, chip ID. The sensor data is complemented with a dedicated calibration algorithm which can be tailor-made to fit the optical sensor or the optical sensor chip. In order to retrieve the sensor response data and the calibration algorithm both can be made available by means of the chip ID, for example.

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Patent Owner(s)

Patent OwnerAddress
AMS SENSORS GERMANY GMBH07745 JENA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Höppler, Thomas Jena, DE 1 1
Jazayerifar, Mahmoud Jena, DE 3 2
Komma, Julius Jena, DE 9 2
Nimz, Thomas Jena, DE 3 2
Siess, Gunter Jena, DE 19 27

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