Fine ratio measuring method and apparatus
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United States of America Patent
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Jan 21, 2025
Grant Date -
Jun 30, 2022
app pub date -
Apr 3, 2020
filing date -
Apr 5, 2019
priority date (Note) -
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Abstract
A fine ratio measuring method and apparatus. The fine ratio measuring method includes a step S1 of measuring a distance between a distance measuring device and lumps of material, a step S2 of calculating a feature quantity from distance data obtained in the step S1, and a step S3 of converting the feature quantity calculated in step S2 to a fine ratio. The feature quantity calculated in step S2 represents distance variation calculated from the distance data obtained in the step S1. A higher fine ratio in lumps of material means greater microscopic distance variation caused by microscopic irregularities in the surface of the lumps of material in the height direction within a three-dimensional shape. Therefore, by using the distance variation as the feature quantity, the fine ratio in the lumps of material can be measured in real time with high accuracy.
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