Semiconductor SWCNT slurry for bioimaging and method for inspecting the same

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United States of America

PATENT NO 12257324
APP PUB NO 20200384127A1
SERIAL NO

16764590

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Abstract

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An object is to provide a method of inspection enabling a slurry of a batch resulting in abnormal accumulation to be identified in advance, and to provide an SWCNT slurry for bioimaging that has undergone the inspection.

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Patent Owner(s)

Patent OwnerAddress
SHIMADZU CORPORATION1 NISHINOKYO KUWABARA-CHO NAKAGYO-KU KYOTO-SHI KYOTO 604-8511
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY3-1 KASUMIGASEKI 1-CHOME CHIYODA-KU TOKYO 100-8921

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iizumi, Yoko Ibaraki, JP 3 5
Kataura, Hiromichi Ibaraki, JP 17 185
Okazaki, Toshiya Ibaraki, JP 3 5
Takeuchi, Tsukasa Kyoto, JP 11 5
Yudasaka, Masako Ibaraki, JP 49 403

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