Semiconductor memory device capable of concurrently diagnosing a plurality of memory banks and method thereof

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United States of America Patent

PATENT NO 6501690
APP PUB NO 20010000449A1
SERIAL NO

09730787

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Abstract

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A memory diagnostic circuit includes: a diagnostic circuit which sets a plurality of memory banks to an access/enable state at one time, writes predetermined common data into the memory banks, and parallelly reads out storage data of the plurality of memory banks; a comparison circuit which compares the data read out from the plurality of memory banks with the data written into the memory banks; and a discrimination circuit which discriminates whether or not there is any defect in the plurality of memory banks based on a comparison result.

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Patent Owner(s)

  • NEC CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Satoh, Masaru Tokyo, JP 19 113

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