Memory structure in ferroelectric nonvolatile memory and readout method therefor

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6362500
APP PUB NO 20010000688A1
SERIAL NO

09749960

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

Each of memory cells of a ferroelectric nonvolatile memory includes a MOS field effect transistor and first and second ferroelectric capacitors whose remnant polarization amounts are substantially equal to each other. One-side electrodes of the first and second ferroelectric capacitors are connected to the gate electrode of the MOS field effect transistor. Information is stored by polarizing the thin ferroelectric films of the first and second ferroelectric capacitors in opposite directions to each other with respect to the gate electrode of the MOS field effect transistor. Information is read out by applying a positive voltage pulse to one of the other electrodes of the first and second ferroelectric capacitors while the other one of the other electrodes is kept in the electrically floating state. Further a negative voltage pulse having an absolute value smaller than the positive voltage pulse may be applied, if necessary.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

  • FUJITSU SEMICONDUCTOR LIMITED

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishiwara, Hiroshi Tokyo, JP 7 63

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation