Split resistor probe and method

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6362635
SERIAL NO

09774195

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Disclosed is a system and method for probing target pads in a dense pad array while minimizing distortion of a signal on the pads probed due to the probe load on the target pads and minimizing an amount of cross-talk between aggressor conductors in the dense pad array and the probe tip. In one embodiment, a probe tip arrangement is provided comprising a pad located in a dense pad array and a first probe tip resistor having first and second ends, the first end being coupled to the pad. The first probe tip resistor is positioned directly adjacent to the pad as closely as manufacturing processes will allow. The probe tip arrangement further includes an access transmission line coupled to the second end of the first probe tip resistor and extending outside of the dense pad array to a second probe tip resistor The second probe tip resistor may, in turn, be coupled to an electrical connector which in turn is coupled to a logic analyzer or oscilloscope to test the signal on the respective pad of the pad array.

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Patent Owner(s)

Patent OwnerAddress
AGILENT TECHNOLOGIES INC5301 STEVENS CREEK BOULEVARD MS 1A-PB SANTA CLARA CA 95051-7201

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Draving, Steven D Colorado Springs, CO 22 411
Kerley, John C Elbert, CO 4 100

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