Semiconductor device testing method and system employing trace data

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6617842
APP PUB NO 20010005132A1
SERIAL NO

09747727

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Abstract

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A method and apparatus for generating a test pattern enabling the detection of malfunctions produced when a semiconductor device is loaded on actual equipment prior to marketing. Using a logical analyzer, signal waveform data collected during the period of signal malfunction is acquired. This signal waveform data is converted by a test pattern generating device into a test pattern for automatic testing equipment. This test pattern is used to change data at the time of malfunction into normal data to generate a pattern of expected values for an output signal of the semiconductor device. Then, it is determined whether the input signal setting required for an output signal of the semiconductor device is present in the signal waveform data. If not, a test pattern for setting the input signal is generated. If the malfunction is reproduced in the testing equipment, the test pattern is used as a mass production test.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
PS4 LUXCO S.A.R.L.LUXEMBOURG, LU168

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nishikawa, Katsumi Tokyo, JP 13 102
Shibata, Kazuo Tokyo, JP 27 310

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