Semiconductor device testing method and system employing trace data
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United States of America Patent
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Sep 9, 2003
Grant Date -
Jun 28, 2001
app pub date -
Dec 22, 2000
filing date -
Dec 24, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for generating a test pattern enabling the detection of malfunctions produced when a semiconductor device is loaded on actual equipment prior to marketing. Using a logical analyzer, signal waveform data collected during the period of signal malfunction is acquired. This signal waveform data is converted by a test pattern generating device into a test pattern for automatic testing equipment. This test pattern is used to change data at the time of malfunction into normal data to generate a pattern of expected values for an output signal of the semiconductor device. Then, it is determined whether the input signal setting required for an output signal of the semiconductor device is present in the signal waveform data. If not, a test pattern for setting the input signal is generated. If the malfunction is reproduced in the testing equipment, the test pattern is used as a mass production test.
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