Methods for wireless testing of integrated circuits
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United States of America Patent
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Feb 3, 2004
Issued Date -
N/A
app pub date -
Jan 16, 2001
filing date -
Mar 23, 1998
priority date (Note) -
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Abstract
A system for testing a microelectronic circuit includes a test bed for mounting a microelectronic circuit, and a signal source for applying a signal to a microelectronic circuit mounted on the test bed. The system additionally includes a test probe for wirelessly receiving electromagnetic response signals from the microelectronic circuit mounted on the test bed. In a preferred form, the electromagnetic response signals are radio-frequency signals. The test system additionally includes a computer connected to be test probe for analyzing the electromagnetic response signals. An integrated circuit for testing on the test system has a test circuit portion that emits electromagnetic radiation in response to a predetermined signal applied to the test circuit.
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