Electron beam measurement method and electron beam irradiation processing device

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United States of America Patent

PATENT NO 6657212
APP PUB NO 20010015412A1
SERIAL NO

09725270

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Abstract

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An electron beam irradiation processing device including an electron beam tube and a current detection unit disposed outside of the window of the electron beam tube. The electron beam tube is adapted to radiate electron beams and has a window and an associated power-source unit that provides a power source. The current detection unit includes at least one of a conductor and a semiconductor covered by an insulating film, and an electron beam level measurement unit having a current measurement unit that measures the current flowing through the current detection unit. The amount of electron beams output from the electron beam tube is controlled by controlling the power-source unit as a function of the current flowing through the current detection unit. In addition, a method of measuring amount of electron beams radiated from an electron beam tube with a window including the steps of providing a current detection unit and measuring amount of electron beams radiated from the electron beam tube by measuring the current flowing through the current detection unit.

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Patent Owner(s)

  • TETRA LAVAL HOLDINGS & FINANCE S.A.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Komori, Minoru Yokohama, JP 8 32
Yamaguchi, Masanoru Himeji, JP 1 14

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