Method of evaluating adsorption of contaminant on solid surface

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United States of America Patent

PATENT NO 6609415
APP PUB NO 20010025524A1
SERIAL NO

09801685

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Abstract

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A test piece made of a material equal to the material of the workpiece is formed in a size that permits the test piece to be housed in an adsorption tube container mounted to a mass analyzing apparatus of a gas chromatograph. The test piece is left to stand for a predetermined time in a measuring site of the atmosphere within a cleansing chamber and, then, recovered. The recovered test piece is introduced into a mass analyzing apparatus of a gas chromatograph (GC-MS apparatus) for measurement of the material of the contaminant and the mass of the contaminant, thereby evaluating the degree of contamination of the measured point.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDTOKYO 100-8280

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishiwari, Syuichi Chiyoda-ku, JP 1 2
Kato, Haruo Ome, JP 34 622

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