Automatic G-factor calibration
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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N/A
Issued Date -
Oct 25, 2001
app pub date -
Feb 26, 2001
filing date -
Feb 25, 2000
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
The invention provides a method by which an instrument can automatically measure the absolute value of fluorescence polarization, FP, despite instrumental offsets, with no a priori knowledge what the actual FP values should be. The invention specifically provides a method for determining multiple G factors to accurately determine the FP values of each probe in samples containing two or more probes.
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