Spectral identification system

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20010043327A1
SERIAL NO

09827455

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A method and apparatus for spectral identification of a material based on a spectral signature. The method is ideally suited for thin film substrate characterization, as found in semiconductor wafer and optical thin film processing.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
MKS INSTRUMENTS INC2 TECH DRIVE SUITE 201 ANDOVER MA 01810

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Barney, Bryan Aptos, CA 1 5
Kamlet, Leonard San Jose, CA 1 5
Spores, Alson Antioch, CA 1 5

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation