Time domain reflectometry measurement instrument
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United States of America Patent
Stats
-
Feb 10, 2004
Grant Date -
Dec 13, 2001
app pub date -
Jun 11, 2001
filing date -
Jun 13, 2000
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.
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