
US Patent Application No: 2002/0005,958
Number of patents in Portfolio can not be more than 2000
Non-contact thickness-measuring device
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Jan 17, 2002
Publication date -
Jul 3, 2001
filing date -
09/897,388
serial no -
ABAN
status
Importance
Abstract
Disclosed is a non-contact type of thickness-measuring device for determining the thickness of a workpiece to be machined. It comprises: a laser light projecting means for projecting a ray of laser light to the top surface of the workpiece at a predetermined angle of incidence relative to the top surface of the workpiece; an imaging means for capturing the first ray of laser light reflected from the top surface of the workpiece and the second ray of laser light passing through the workpiece and reflecting from the bottom surface of the workpiece; and an arithmetic means for determining the thickness of the workpiece from the distance between the first point at which the first ray of laser light falls on the imaging means and the second point at which the second ray of laser light falls on the imaging means.
First Claim
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