Arrangement for spectrally sensitive reflected-light and transmitted-light microscopy
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United States of America Patent
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Issued Date -
Jan 17, 2002
app pub date -
Jan 11, 2001
filing date -
Jul 17, 2000
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The arrangement for spectrally sensitive reflected-light and transmitted-light microscopy comprises an illuminating device which illuminates a sample under study in two dimensions. A scanning device is provided which respectively directs the light emanating from a detection region of the sample under study onto a multiband detector. In one embodiment, the illuminating device is arranged in such a way that it transilluminates the sample in two dimensions. In a further embodiment, the illuminating device illuminates the sample in two dimensions in reflected light.
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