Isolated flip chip of BGA to minimize interconnect stress due to thermal mismatch

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6509529
APP PUB NO 20020011353A1
SERIAL NO

09960164

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A wiring substrate with reduced thermal expansion stress. A wiring substrate, such as a laminated PWB, thin film circuit, lead frame, or chip carrier accepts an integrated circuit, such as a die, a flip chip, or ball grid array package. The wiring substrate has a thermal expansion stress reduction insert, void, or constructive void in a thermal expansion stress region proximate to the integrated circuit. The thermal expansion stress reduction insert or void may extend a selected distance from the edge or edges of the integrated circuit attachment area. The thermal expansion stress reduction insert or void improves the flexibility of the wiring substrate in the region that is joined to the integrated circuit, thus reducing thermal stress between components of the wiring substrate-integrated circuit assembly. In another embodiment, layers of a laminated wiring substrate are intentionally not bonded beneath the chip attach area, thus allowing greater flexibility of the upper layer of the laminate.

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Patent Owner(s)

  • COMCAST CABLE COMMUNICATIONS, LLC

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beilin, Solomon I San Carlos, CA 53 3555
Chazan, David Palo Alto, CA 26 1545
Kamath, Sundar San Jose, CA 4 42
Strandberg, Jan I Cupertino, CA 10 297

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