Circuit for detecting leaky access switches in CMOS imager pixels
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United States of America Patent
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Jan 7, 2003
Grant Date -
Mar 14, 2002
app pub date -
Nov 5, 1997
filing date -
Nov 5, 1997
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Abstract
Disclosed is a CMOS image sensor that includes circuitry for identifying defective pixels, particularly pixels having leaky access switches. The leaky access switches allow charge to escape from the pixel over a row or column line in a pixel array, thereby corrupting the outputs of an entire row or column of pixels. A disclosed test involves (a) electronically setting a defined charge in a selected pixel of the CMOS imager; (b) reading the output of the selected pixel; and (c) comparing the output of the selected pixel to an expected value based upon the defined charge set in the selected pixels. If the output significantly deviates from the expected value, then the selected pixel is identified as having a leaky access switch. Preferably, a newly fabricated sensor is first tested as described. If such leaky access switch is discovered, the imager is discarded without incurring further manufacturing cost. If, on the other hand, the imager is not found to contain a leaky access switch, it may packaged and then subjected to an optical test.
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- 15 United States
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Patent Owner(s)
- SGS-THOMSON MICROELECTRONICS, INC.;STMICROELECTRONICS, INC.
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Kramer, Alan H | Berkeley, CA | 10 | 192 |
Rambaldi, Roberto | Bologna, IT | 6 | 299 |
Tartagni, Marco | Meldola, IT | 26 | 1414 |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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