PATTERN TESTING BOARD
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United States of America Patent
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-
N/A
Issued Date -
Apr 4, 2002
app pub date -
Dec 28, 1998
filing date -
Nov 26, 1996
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A pattern testing system is able to detect an emission beam such as a laser or light beam from a shooting system. A single pattern testing board includes a plurality of paired emission beam sensors and hit indicators. Each emission beam sensor is responsive to a detected emission beam and each hit indicator signals the sensing of the emission beam by the associated emission beam sensor. Multiple pattern testing boards may be mounted together to provide a larger pattern testing system array. Further, an overlay with a representation thereon, a moving image display system, or a reflective moving image display system may be positioned in front of one or more pattern testing boards.
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