Redundant comparator design for improved offset voltage and single event effects hardness

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United States of America Patent

PATENT NO 6563347
APP PUB NO 20020060585A1
SERIAL NO

09973106

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Abstract

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An analog comparator architecture has improved immunity to single event effects and variations in input offset voltage. A conventional single analog comparator-based circuit is replaced with plural comparators, driving a 'majority vote' logic block. The effective input offset voltage of the multi-comparator design is the middle one of the individual comparators' input offset voltages. A single event upset on any comparator may momentarily perturb its output into the incorrect state; however, the output of the majority voting logic block will remain in the correct state, as only one comparator is upset. In addition, where a heavy ion strike on any comparator's bias current source causes a momentary loss of bias current, this upsets only one comparator, so that the output of the voting logic block is unaffected.

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Patent Owner(s)

  • INTERSIL AMERICAS INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Doyle, Brent R Malabar, FL 8 36
Swonger, James W Palm Bay, FL 9 181

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