Testing head having vertical probes
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Jun 13, 2002
app pub date -
Aug 3, 2001
filing date -
Aug 4, 2000
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A testing head having vertical probes is presented. The testing head comprises a guide plate having a guide hole formed therethrough, for accommodating a contact probe having a contact tip that is arranged to mechanically and electrically contact a contact pads on a device under test. The contact probe has a pre-deformed section placed in a flexion region between the guide plate and the test device, arranged to further deform as the contact pad of the test device is drawn against the contacting tip.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully