Test method of electro-optical device, test circuit of electro-optical device, electro-optical device, and electronic equipment
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United States of America Patent
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Mar 9, 2004
Grant Date -
Jun 13, 2002
app pub date -
Nov 28, 2001
filing date -
Dec 7, 2000
priority date (Note) -
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status (Latency Note)
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Abstract
The invention performs an accurate testing in order to determine the presence or absence of a defect in a wiring and electrodes in an electro-optical device. A test method is provided for testing an electro-optical device that includes a capacitor arranged at an intersection of each scanning line and each data line. A test switching element connected between the data line and a reading signal-line is turned on after storing a charge responsive to a data signal in the capacitor so that the voltage responsive to the charge stored in the capacitor is output to the reading signal-line. The timing of switching on the test switching element is set to be different from the timing of a level change of a test clock pulse that defines the operation of a test circuit.
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