Simultaneous testing of multiple optical circuits in substrate

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20020084793A1
SERIAL NO

09752171

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An improved method and apparatus for testing an optical circuit simultaneously contacts and allows testing of a plurality of optical circuits in a substrate before the optical circuits are cut from the substrate.

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Patent Owner(s)

Patent OwnerAddress
HUNG HENRY HNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Anjan, Yellapu Scottsdale, AZ 12 197
El-Wailly, Tamim Peoria, AZ 2 50
Hung, Henry H Phoenix, AZ 13 288

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